Patent · US Active

X-ray system and calibration method therefor

US7553081B2 · kind B2 · utility

2Cited by

1References

8Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Dieter Ritter · Bad Mergentheim, DE
Christian Schmidgunst · Erlangen, DE

Key dates

Filing date	Sep 26, 2007
Grant date	Jun 30, 2009
Priority date	—
Expiry date	Dec 3, 2027

Classification

Technology area (CPC H)Electricity
CPC primaryH04N25/671
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

In a method for calibration of an image-generating x-ray system with a digital x-ray receiver and an x-ray system operating with this calibration method, a number of first offset-corrected bright images are determined at a first constant reference temperature of the x-ray receiver respective at a number first dose settings. A second offset-corrected bright image are subsequently determined at a number of second reference temperatures and at second dose settings that correspond to respective first dose settings. A quotient image is calculated from the second bright image and the first bright image for each of these reference temperatures and is stored. A multi-point calibration at various reference temperatures is implemented with low time expenditure in this manner.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.