Patent · US Active

Polishing slurries and methods for chemical mechanical polishing

US7553430B2 · kind B2 · utility

1Cited by
53References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 29, 2006
Grant dateJun 30, 2009
Priority date
Expiry dateSep 29, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/3212
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

Aqueous polishing slurries for chemical-mechanical polishing are effective for polishing copper at high polish rates. The aqueous slurries according to the present invention may include soluble salts of molybdenum dissolved in an oxidizing agent and molybdic acid dissolved in an oxidizing agent. Methods for polishing copper by chemical-mechanical planarization include polishing copper with low pressures using a polishing pad and a aqueous slurries including soluble salts of molybdenum dissolved in an oxidizing agent and molybdic acid dissolved in an oxidizing agent, particles of MoO3 dissolved in an oxidizing agent, and particles of MoO2 dissolved in an oxidizing agent.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.