Method for determination and evaluation of a shim parameter set for controlling a shim device in a magnetic resonance apparatus

US7554327B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Andrew Dewdney · Fairview Avenue, DE
• Sabrina Harter · Erlangen, DE

Key dates

• Filing date: Oct 12, 2007
• Grant date: Jun 30, 2009
• Expiry date: Oct 12, 2027

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R33/543
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In a method for determination and evaluation of a shim parameter set for controlling a shim device in a magnetic resonance (MR) apparatus, the shim device is set using a first shim parameter set, a first field distribution is measured in a body region encompassing a target volume from which MR data are to be acquired, a second shim parameter set is determined using an algorithm for optimization of the field homogeneity in the target volume on the basis of the first shim parameter set and dependent on the first field distribution, a second field distribution is determined on the basis of the second shim parameter set, and the shim parameter sets are evaluated by indirect or direct comparison of the first field distribution and the second field distribution, in particular in the target volume.