Method and apparatus to monitor a temperature sensing device
US7555411B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 31, 2007 |
| Grant date | Jun 30, 2009 |
| Priority date | — |
| Expiry date | Jan 31, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K15/007
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and an article of manufacture are provided to monitor a temperature sensing circuit and detect a fault therein. The method comprises monitoring sensor readings output from a plurality of temperature sensing circuits. An average sensor reading is determined, calculated from the sensor readings output from a subset of the temperature sensing circuits. Each of the sensor readings is compared to the average sensor reading. A fault is identified when one of the sensor readings deviates from the average sensor reading by an amount greater than a threshold, more particularly when one of the sensor readings deviates from the average sensor reading by an amount greater than the threshold at least a quantity of X times out of Y sensor readings.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.