Method for determining a characteristic of a sensor arrangement
US7558691B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2007 |
| Grant date | Jul 7, 2009 |
| Priority date | — |
| Expiry date | Aug 28, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K15/007
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is disclosed for determining a characteristic of a sensor arrangement having at least one measuring sensor and at least one reference sensor for recording the same physical variable, and having an analysis unit electrically connected thereto. The characteristic is determined from measured values of the at least one measuring sensor and of the at least one reference sensor. It is proposed to record a characteristic point during continuous measurement operation, starting with the first time the sensor arrangement is put into operation, when a definable measurement point is reached in a process for the first time, if the changes in measured value in the variation over time of the at least one measuring sensor and in the variation over time of the at least one reference sensor remain within a definable tolerance band within a definable time interval.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.