Patent · US Active

Semiconductor apparatus and clock generation unit

US7558998B2 · kind B2 · utility

3Cited by
3References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 9, 2005
Grant dateJul 7, 2009
Priority date—
Expiry dateJul 1, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318552
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A semiconductor apparatus generates a clock signal used for scan test on an internal circuit of the semiconductor apparatus. The semiconductor apparatus includes a scan chain for performing input and output of data in the internal circuit, a clock generator for generating a launch clock signal for sending data to the internal circuit and a capture clock signal for capturing data from the internal circuit. The launch clock signal and the capture clock signal are generated based on a plurality of clock signals having different phases, and a pulse width of the plurality of clock signals is smaller than half of a cycle of the plurality of clock signals.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.