High-sensitivity mass spectrometer and method
US7560689B2 · kind B2 · utility
2Cited by
4References
10Claims
0Family size
Assignee
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Key dates
| Filing date | Mar 6, 2007 |
| Grant date | Jul 14, 2009 |
| Priority date | — |
| Expiry date | Nov 21, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0418
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A sample is sliced obliquely with a blade provided with a metal thin film on the surface, and the slice of the sample adhering to the blade surface is subjected to mass spectrometry. As a result, the section of the sliced sample can be analyzed immediately by mass spectrometry with high sensitivity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.