Integrated circuit failure prediction
US7560945B2 · kind B2 · utility
4Cited by
23References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 6, 2007 |
| Grant date | Jul 14, 2009 |
| Priority date | — |
| Expiry date | Jul 9, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31721
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit having a frequency generator connected to a constant reference voltage source located on the integrated circuit and a monitor connected to monitor the frequency signal and from the frequency history predicting that an integrated circuit failure will occur. An adaptive power supply is disclosed that includes a frequency generator connected to a bandgap voltage source and is monitored for changes in the frequency generator output. From this change a prediction is made as to that a failure condition will occur.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.