Patent · US Active

Device and method for measurement of surfaces

US7561273B2 · kind B2 · utility

118Cited by

4References

18Claims

0Family size

Assignee

MICRO-EPSILON-MESSTECHNIK GMBH & CO. KG · DE

Inventors

Torsten Stautmeister · Neuschönborn, DE
Bernhard Messerschmidt · Jena, DE
Karl Wisspeinter · Ortenburg, DE

Key dates

Filing date	Nov 13, 2007
Grant date	Jul 14, 2009
Priority date	—
Expiry date	Nov 13, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/0064
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a device for measuring surfaces and to a method, which uses, preferably, the device. The device comprises a light source which is used to produce a multi-colored light beam. The light beam can be focused by an imaging optical system on a plurality of points which are arranged at different distances from the imaging optical system, using the chromatic aberration of the optics. The focused light beam can be deviated to a point of the surface. A sensor device is provided in order to detect the reflected light beam. The aim of the invention is to maintain the largest distance possible between the measuring head and the object. The imaging optical system comprises an optical system for the targeted circulation of a chromatic aberration and an additional optical system which is used to form the focused light beam emerging from the imaging optical system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.