Method and apparatus for automated feature selection
US7562054B2 · kind B2 · utility
1Cited by
3References
30Claims
0Family size
Assignee
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Key dates
| Filing date | Jul 9, 2004 |
| Grant date | Jul 14, 2009 |
| Priority date | — |
| Expiry date | May 25, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F18/211
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for automated feature selection is provided. One or more initial sets of features are generated and evaluated to determine quality scores for the feature sets. Selected ones of the feature sets are (i) chosen according to the quality scores and modified to generate a generation of modified feature sets, (ii) the modified feature sets are evaluated to determine quality scores for the modified feature sets, and (i) and (ii) are repeated until a modified feature set is satisfactory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.