Method and device for time-gating the sensitivity of an imager structure
US7564022B1 · kind B1 · utility
4Cited by
3References
14Claims
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Key dates
| Filing date | Feb 29, 2008 |
| Grant date | Jul 21, 2009 |
| Priority date | — |
| Expiry date | Feb 29, 2028 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/80
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for time-gating the sensitivity of an imager structure having a plurality of photodiodes comprises applying an electric field over the photodiodes, the electric field having an amplitude and a polarity so as to reverse bias or slightly forward bias the photodiodes at a bias voltage below 0.5 Volts, and varying the photodiodes between high and low charge collection efficiency or sensitivity by changing the amplitude of the electric field over the photodiodes. A corresponding imager structure is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.