Adsorption, detection and identification of components of ambient air with desorption/ionization on silicon mass spectrometry (DIOS-MS)
US7564027B2 · kind B2 · utility
36Cited by
19References
20Claims
0Family size
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Key dates
| Filing date | Feb 9, 2004 |
| Grant date | Jul 21, 2009 |
| Priority date | — |
| Expiry date | May 5, 2025 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/25
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a device, system, and associated methods to actively or passively sample air by directing it onto the surface of a porous light-absorbing semiconductor, for example, a desorption/ionization on porous silicon (“DIOS”) chip. Upon adsorption of an analyte, the surface may be analyzed directly by laser desorption/ionization time-of-flight mass spectrometry. Because the process of laser desorption/ionization and subsequent mass detection does not require elevated temperatures, thermal degradation of analytes is avoided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.