Sample ionization at above-vacuum pressures
US7564029B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 15, 2007 |
| Grant date | Jul 21, 2009 |
| Priority date | — |
| Expiry date | Feb 5, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/044
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Sample material ionized in a sample receiving chamber is flowed into a sample conduit. Drying gas may also flow into the sample conduit and may be heated. The pressure and length of the sample conduit may be provided according to the product 50 or greater Torr−cm. The sample conduit may include a turn. The sample conduit may lead to an ion extraction chamber at which a sampling orifice may lead to a mass spectrometer. The diameter of the sample conduit may be larger than the diameter of the sampling orifice. An electrical field may be applied in the ion extraction chamber to slow incoming ions. A voltage jump may be applied to the sample conduit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.