Thermal fly height induced shield instability screening for magnetoresistive heads
US7564236B1 · kind B1 · utility
5Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 1, 2008 |
| Grant date | Jul 21, 2009 |
| Priority date | — |
| Expiry date | Jul 1, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/093
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for testing magnetic heads formed on a wafer to detect the presence of thermal induced popcorn noise resulting from thermal fly height control. The method includes performing a quasi test on a magnetic head, the quasi test being performed over 400 or more cycles of magnetic field application. For additional test accuracy, the write head can be cycled while 400 or more cycles of magnetic field are generated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.