Pixel defect detecting/correcting device and pixel defect detecting/correcting method
US7564491B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 11, 2003 |
| Grant date | Jul 21, 2009 |
| Priority date | — |
| Expiry date | Jan 25, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/843
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A pixel defect detecting and correcting apparatus and method for detecting and correcting defects where the number of correctable defect pixels is not restricted to the capacity of a memory. The apparatus includes a color difference and luminance calculating block which calculates the absolute values of the color differences of adjacent pixels and a defect judgment target pixel, and color difference and luminance data. The apparatus also includes a maximum and minimum data values detecting block; a color difference interpolated value calculating block and a luminance interpolated value calculating block which obtain the color difference interpolated values and luminance interpolated values of the defect judgment target pixel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.