Spectrophotometer with wide inlet slit
US7564560B2 · kind B2 · utility
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3References
8Claims
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Key dates
| Filing date | Nov 29, 2006 |
| Grant date | Jul 21, 2009 |
| Priority date | — |
| Expiry date | Aug 20, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/453
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectrophotometer incorporating an interferometer and a dispersive system is adapted to have an enlarged inlet field without degrading its spatial resolution. To this end, spectral data deduced horn measurements performed by means of the interferometer are transferred into spectral data deduced from measurements per formed by means of the dispersive system. Such spectrophotometer makes it possible to scan an observation field quickly, and is compatible with use on board a satellite.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.