Methods and apparatus for integrity measurement of virtual machine monitor and operating system via secure launch
US7565522B2 · kind B2 · utility
10Cited by
0References
22Claims
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Assignee
Inventors
Key dates
| Filing date | May 10, 2004 |
| Grant date | Jul 21, 2009 |
| Priority date | — |
| Expiry date | Mar 12, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F21/57
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and apparatus to measure the integrity of a virtual machine monitor and an operating system via secure launch are disclosed. In one example, a method measures a first characteristic of a virtual machine monitor, stores the first measured characteristic in a first hardware protected location, measures a second characteristic of an operating system with the virtual machine monitor, wherein the measuring of the second characteristic is initiated by the operating system, and stores the second measured characteristic in a second hardware protected location.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.