Methods to assess quality of microarrays
US7569343B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 27, 2003 |
| Grant date | Aug 4, 2009 |
| Priority date | — |
| Expiry date | Oct 16, 2023 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB01J2219/00731
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention relates to methods and compositions for assessing the quality of microarrays. In particular, the invention relates to the use of quality control probes that are synthesized on the microarray monomer by monomer in a step-by-step synthesis. By assessing the degree of signal from the quality control probes and determining their deviation from expected signal intensities, the quality of microarray synthesis can be ascertained. The invention further relates to a method of detecting defects occurring during storage or processing of the microarray. The invention further relates to a method of using a computer to identify microarrays that have had a defect or defects during synthesis, storage, or processing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.