X-ray inspection apparatus and method for creating an image processing procedure for the X-ray inspection apparatus
US7570787B2 · kind B2 · utility
9Cited by
6References
16Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 25, 2005 |
| Grant date | Aug 4, 2009 |
| Priority date | — |
| Expiry date | Sep 23, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray inspection apparatus is provided with a shied box, a conveyor, an X-ray irradiator, an X-ray line sensor, a monitor, and a control computer to enable the apparatus to inspect an article by automatically selecting an appropriate image processing procedure that is most appropriate for the article. The control computer creates function blocks comprising an image forming section, an image processing procedure adoption determination unit, and a contaminant determination unit as a CPU loads various programs stored in a memory units such as HDD.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.