Parametric measurement of high-speed I/O systems
US7571363B2 · kind B2 · utility
5Cited by
10References
42Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 18, 2006 |
| Grant date | Aug 4, 2009 |
| Priority date | — |
| Expiry date | Apr 16, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31715
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A phase comparator is used to test a device under test comprising an input/output (I/O) circuit by applying a signal to the device under test; extracting a phase signal from the phase comparator; and determining parametric information pertaining to the I/O circuit of the device under test from the phase signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.