Non-collinear end-to-end structures with sub-resolution assist features
US7572557B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 7, 2005 |
| Grant date | Aug 11, 2009 |
| Priority date | — |
| Expiry date | Jul 24, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03F1/36
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Sub-resolution assist features for non-collinear features are described for use in photolithography. A photolithography mask with elongated features is synthesized. An end-to-end gap between two features if found for which the ends of the two features facing the gap are linearly offset from one another. A sub-resolution assist feature is applied to the end-to-end gap between the elongated features, and the synthesized photolithography mask is modified to include the sub-resolution assist feature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.