Patent · US Active

Non-collinear end-to-end structures with sub-resolution assist features

US7572557B2 · kind B2 · utility

5Cited by
0References
15Claims
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Key dates

Filing dateDec 7, 2005
Grant dateAug 11, 2009
Priority date
Expiry dateJul 24, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F1/36
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Sub-resolution assist features for non-collinear features are described for use in photolithography. A photolithography mask with elongated features is synthesized. An end-to-end gap between two features if found for which the ends of the two features facing the gap are linearly offset from one another. A sub-resolution assist feature is applied to the end-to-end gap between the elongated features, and the synthesized photolithography mask is modified to include the sub-resolution assist feature.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.