Integrated test method on multi-operating system platform
US7574624B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 20, 2007 |
| Grant date | Aug 11, 2009 |
| Priority date | — |
| Expiry date | Apr 19, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2284
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An integrated test method on a multi-operation system (OS) platform for performing an integrated test of a file system and disk performance in a computer with an extended firmware interface (EFI) system environment on multiple OS platforms is provided. The method includes the following steps. Scan sectors of an entire physical hard disk and perform a hardware underlying test of a disk device in the EFI environment; select and load an OS, then enter the OS environment to test the file system and the disk performance in the system environment; exit from the OS and return to the EFI environment to summarize a test result; determine whether it is necessary to load other OSes, if necessary, return and load other OSes, and if not, send the summarized test result to a server terminal for analysis and processing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.