Patent · US Expired

Ion detection methods, mass spectrometry analysis methods, and mass spectrometry instrument circuitry

US7576324B2 · kind B2 · utility

2Cited by
16References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 3, 2004
Grant dateAug 18, 2009
Priority date
Expiry dateJan 3, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/025
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Ion detection methods are provided that can include applying a first voltage between a power source and a dynode, and contacting the dynode with first ions to create a first charged species. After applying the first voltage, a second voltage can be applied between the power source and the dynode, and the dynode can be contacted with second ions to create a second charged species. Mass spectrometry instrument circuitry is also provided that can include a power source coupled to a dynode via at least one switch with the switch being operatively configured in one position to apply a first voltage between the dynode and the power source, and, in another position, configured to apply a second voltage between the dynode and the power source. Mass spectrometry analysis methods are also provided that can include detecting sorted ions using a dynode configured according to an ion detection parameter with the ion detection parameter including first and second dynode values associated with first and second time values. Methods and circuitry for portable instrumentation are also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.