Circuit for dynamic circuit timing synthesis and monitoring of critical paths and environmental conditions of an integrated circuit
US7576569B2 · kind B2 · utility
25Cited by
10References
26Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 13, 2006 |
| Grant date | Aug 18, 2009 |
| Priority date | — |
| Expiry date | Sep 6, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A circuit for dynamically monitoring the operation of an integrated circuit under differing temperature, frequency, and voltage (including localized noise and droop), and for detecting early life wear-out mechanisms (e.g., NBTI, hot electrons).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.