Pattern identification method, device thereof, and program thereof
US7577297B2 · kind B2 · utility
40Cited by
4References
30Claims
0Family size
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Key dates
| Filing date | Dec 16, 2003 |
| Grant date | Aug 18, 2009 |
| Priority date | — |
| Expiry date | Jun 29, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F18/213
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a pattern identification device performing pattern identification of data which has been input by hierarchically extracting features, a primary feature is extracted and distribution of at least one feature extraction result extracted is analyzed, a secondary feature is extracted according to this analysis result. Thus, it is possible to perform pattern identification robustly against fluctuations of the input pattern at a reduced processing cost while reducing the probability of occurrence of incorrect identification.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.