Method and system for improving target localization and characterization
US7577544B2 · kind B2 · utility
1Cited by
10References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Jun 26, 2007 |
| Grant date | Aug 18, 2009 |
| Priority date | — |
| Expiry date | Jul 24, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/022
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining a location and characterization of an object using a magnetic gradient tensor measurement of the object is provided. The method includes determining an object magnetic field candidate predicted from one of an object measured magnetic field gradient and an assumed object magnetic moment magnitude, and determining an object vector location and an object vector magnetic moment by combining the object magnetic field candidate with an object measured magnetic field.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.