Patent · US Expired

Method and apparatus for analyzing integrated circuit operations

US7577930B2 · kind B2 · utility

2Cited by
142References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 23, 2005
Grant dateAug 18, 2009
Priority date
Expiry dateMar 31, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318544
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for viewing and/or analyzing the operations and logical states of an integrated circuit. The logical state of various flip-flops within the ASIC may be determined at a specified time. The embodiment may store these flip-flop states in a computer-readable data structure, such as a file or database. By repeating this process and incrementing or decrementing the time with each repetition, a more complete picture of the ASIC's operation may be captured. Additionally, the embodiment may graphically display the flip-flop states, for example as a graph or waveform.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.