Electrical contact device of probe card
US7579857B2 · kind B2 · utility
3Cited by
4References
26Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 17, 2006 |
| Grant date | Aug 25, 2009 |
| Priority date | — |
| Expiry date | May 12, 2027 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49155
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electrical contact device of a probe card includes a base and probes on the base. The base has a top side with a cavity thereon, and the cavity has sidewalls connected to the top side. Anchored portion are provided on the sidewalls of the cavity. Each of the probes has a first end and a second end, wherein the first end is connected to the anchored portion, and the second end is extended toward the cavity respectively.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.