Optical image system surface resolution calibration method
US7580590B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 8, 2006 |
| Grant date | Aug 25, 2009 |
| Priority date | — |
| Expiry date | Feb 28, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/80
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An optical image system surface resolution calibration method is provided herein, which utilizes a calibration standard and an image sensor device. The surface of the calibration standard is provided with a plurality of interleaving bright lines and dark lines, the calibration standard is disposed in a plane to be measured, and the image sensor device is provided with an imaging means, a memory means, and a logic-arithmetic means, that is used to fetch the image information of the calibration standard and store the image information thus obtained. Meanwhile, the image sensor device is used to select and calculate the linear equations of the bright lines, and finally calculate the magnification factor of the image fetched by the image sensor device through the geometric mathematical means by making use of the slope and intersection distance of the linear equation and the average distance between the adjacent bright lines calculated from the intersection distance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.