System and method for rating reliability of storage devices
US7580956B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 4, 2006 |
| Grant date | Aug 25, 2009 |
| Priority date | — |
| Expiry date | Jan 24, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for rating reliability of storage devices is disclosed. A reliability rating for a group of storage devices is assigned to a first rating. The first rating indicates an expected reliability that is the same for each individual one of the storage devices in the group. The expected reliability provides an indication of how reliable the storage devices in the group are expected to be. Information indicating one or more operational characteristics for one or more of the storage devices in the group may be periodically received and analyzed to determine whether the reliability rating for the group of storage devices should be changed. If so then the reliability rating for the group is changed to a different rating, e.g., to indicate either a decrease or an increase in the expected reliability of the storage devices in the group.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.