Modular x-ray measurement system
US7582879B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 26, 2007 |
| Grant date | Sep 1, 2009 |
| Priority date | — |
| Expiry date | Mar 26, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/2985
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
An x-ray detector assembly includes a first substrate and a second substrate. An array of photodetectors, which have coplanar contacts, are disposed on the top surface of the first substrate. The x-ray detector assembly further includes a plurality of x-ray scintillator elements arranged in an array. The photodetectors are aligned so as to match the array of x-ray scintillator elements. The second substrate is fused to the bottom surface of the first substrate. The second substrate provides on its distal side a planar connectivity pattern matched to electronics of a signal acquisition system. One or more through-hole connections traverse both substrates, and are configured to couple the contacts of the photodetectors from the top surface of the first substrate to the connectivity pattern on the distal side of the second substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.