Analog-to-digital conversion circuit
US7583211B1 · kind B1 · utility
3Cited by
6References
17Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 8, 2008 |
| Grant date | Sep 1, 2009 |
| Priority date | — |
| Expiry date | Feb 8, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/182
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
An analog-to-digital conversion circuit and a method for calibrating an analog-to-digital conversion circuit are provided. A digital translation of an analog voltage is analyzed to determine a characteristic value of the analog voltage. A reference voltage, with which the digital translation is generated, is set to a value that is a minimum amount greater than the characteristic value. Additional embodiments include setting an offset voltage, with which the digital translation is also generated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.