Position measurement system
US7583388B2 · kind B2 · utility
3Cited by
12References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 12, 2006 |
| Grant date | Sep 1, 2009 |
| Priority date | — |
| Expiry date | Dec 20, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.