System and method for testing voltage endurance
US7586315B2 · kind B2 · utility
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18Claims
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Key dates
| Filing date | Aug 10, 2007 |
| Grant date | Sep 8, 2009 |
| Priority date | — |
| Expiry date | Nov 22, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2839
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for testing voltage endurance of a electronic component, includes: generating an oscillating signal; amplifying the oscillating signal; transforming the amplified oscillating signal to generate a transformed signal; blocking a negative voltage of the transformed signal to generate a test signal to be transmitted to the electronic component; and detecting electrical characteristics of the electronic component to generate result data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.