Method for testing analog and mixed-signal circuits using dynamic element matching for source linearization
US7587647B2 · kind B2 · utility
5Cited by
3References
29Claims
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Key dates
| Filing date | Jul 30, 2004 |
| Grant date | Sep 8, 2009 |
| Priority date | — |
| Expiry date | Aug 19, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3167
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of testing an analog and/or mixed-signal circuit can be used in either a production or a built-in self test environment. The method includes generating an excitation signal for testing by using dynamic element matching for performance enhancement of the test signal generator that applies an excitation, and/or by measuring an output of the DUT using dynamic element matching for performance enhancement of an output measurement device. Signal generators and circuits using aspects of the method are also discussed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.