Method and related apparatus for calibrating signal driving parameters between chips
US7587651B2 · kind B2 · utility
10Cited by
3References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 10, 2005 |
| Grant date | Sep 8, 2009 |
| Priority date | — |
| Expiry date | Jan 31, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F13/4269
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A calibrating method for adjusting related parameters when a first chip and a second chip switch signals is disclosed. The calibrating method includes: utilizing the first chip to output a test signal through using a first driving force in order to represent a test value; utilizing the second chip to receive the test signal and utilizing the second chip to read the test signal to determine a value; and performing a comparison step for comparing the value with the test value to detect whether said value complies with the test value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.