Soak profiling
US7589520B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 5, 2006 |
| Grant date | Sep 15, 2009 |
| Priority date | — |
| Expiry date | Dec 5, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2874
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for soaking a device in an automated testing system, includes setting a temperature control device to a first temperature, exposing the device to the temperature control device, and driving the temperature control device to a second temperature. The temperature transition rate from the first temperature to the second temperature is derived from a first natural decay rate. The first natural decay rate is based on a first-order thermal response of the device when the device is suspended in free air. The second temperature of the temperature control device is relative to a set point temperature so that when the device is socketed for testing, the temperature of the device settles at the set point temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.