Methods and systems for semiconductor diode junction screening and lifetime estimation
US7592825B1 · kind B1 · utility
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12References
19Claims
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Key dates
| Filing date | Aug 22, 2006 |
| Grant date | Sep 22, 2009 |
| Priority date | — |
| Expiry date | Jan 31, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2635
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Screening methods and systems that can detect semiconductor junction devices that may exhibit sudden failure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.