Apparatus and methods for measuring workpieces
US7593117B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 14, 2006 |
| Grant date | Sep 22, 2009 |
| Priority date | — |
| Expiry date | Aug 23, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03H1/06
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
The invention relates to systems and methods for measuring workpieces. In one embodiment of the invention, a system for measuring a workpiece includes a plurality of measurement modules, an electronic control module, and a moveable frame to which the measurement modules are attached. Each of the measurement modules comprises at least one galvanometer, at least one mirror, and at least one optical displacement sensor. The plurality of measurement modules are collectively adapted to measure a circumference of the workpiece. In other embodiments, methods of calibration and use are provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.