Contour measuring probe for measuring aspects of objects
US7594338B2 · kind B2 · utility
1Cited by
6References
14Claims
0Family size
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Inventors
Key dates
| Filing date | Dec 28, 2007 |
| Grant date | Sep 29, 2009 |
| Priority date | — |
| Expiry date | Apr 2, 2028 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S33/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An exemplary contour measuring probe (10) includes a tip extension (16) and two driving members (13). The tip extension is configured for touching a surface of an object. The driving members are configured for driving the tip extension linearly moving along a first direction. The driving members are tapered and a diameter of each driving member increases along the first direction. The driving members are driven to move by gas pressure acting on an outer side surface thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.