Probing apparatus for illuminating an electrical device under test
US7595628B1 · kind B1 · utility
4Cited by
2References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 4, 2008 |
| Grant date | Sep 29, 2009 |
| Priority date | — |
| Expiry date | Jun 4, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for probing an electrical device under test is provided. The probe comprises a selectively positionable door defining a recessed compartment and a light source positioned within the recessed compartment. When the door is in a first position, the compartment is closed, and when the door is in a second position, the compartment is opened. When opened, the light source is reflected from a reflective surface of the door to illuminate a device being probed. The door may further comprise a magnifying element to allow for magnification of the area being probed by a user.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.