Patent · US Active

Tomographic measuring system and method for conducting measurements

US7595640B2 · kind B2 · utility

1Cited by

4References

18Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Ralf Ladebeck · Erlangen, DE
Georg Pirkl · Dormitz, DE

Key dates

Filing date	Jan 15, 2008
Grant date	Sep 29, 2009
Priority date	—
Expiry date	Jan 15, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01R33/3692
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A tomographic measuring system is disclosed with at least two tomographic measuring devices, of which at least a first can interfere with a second in a manner disadvantageous for conducting measurements. In at least one embodiment, the system includes a switching-off mechanism at least in the first measuring device; and at least one external connection to the first measuring device for transmitting a switching-off signal to the switching-off mechanism, if the second measuring device is conducting a measurement or will conduct one. A method for conducting measurements with an appropriate tomographic measuring system is also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.