Rapid spatial averaging over an extended sample in a Raman spectrometer
US7595873B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 11, 2008 |
| Grant date | Sep 29, 2009 |
| Priority date | — |
| Expiry date | Jun 11, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/656
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical method and apparatus is utilized to provide rapid spatial averaging over a large sample area in a Raman spectrometer, without defocusing of the optical source or the collection optics. Spatial averaging provides a representative spectrum of a sample that is inhomogeneous, either in its composition or surface characteristics. The spatial averaging configurations and methods disclosed herein also reduce sample degradation or burning resulting from the high intensity of the directed optical source. Moreover, the dimensions of the sample area of the spatial averaging methods and configurations of the present invention are adjusted to match specific sampling requirements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.