Method for estimating end use qualities of wheat at growth stage
US7598038B2 · kind B2 · utility
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2Claims
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Key dates
| Filing date | Sep 15, 2005 |
| Grant date | Oct 6, 2009 |
| Priority date | — |
| Expiry date | Jun 17, 2026 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC12Q2600/158
- WIPO fieldBiotechnology
- WIPO sectorChemistry
Abstract
The invention provides a means for estimating the end use qualities of wheat flour that will be obtained in the future from the harvested wheat at an early stage before maturation of the wheat seeds. The invention relates to a method for estimating the end use qualities of a matured wheat seed, comprising measuring the expression level of at least 1 gene selected from genes, each of which is defined by any one of the nucleotide sequences of SEQ ID NOS: 1 to 121 in immature wheat.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.