Patent · US Expired

Sacrificial benzocyclobutene/norbornene polymers for making air gap semiconductor devices

US7598114B2 · kind B2 · utility

2Cited by
14References
18Claims
0Family size

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Key dates

Filing dateJan 30, 2004
Grant dateOct 6, 2009
Priority date
Expiry dateJul 20, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/7682
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of forming an air gap within a semiconductor structure by the steps of: (a) using a sacrificial polymer to occupy a space in a semiconductor structure; and (b) heating the semiconductor structure to decompose the sacrificial polymer leaving an air gap within the semiconductor structure, wherein the sacrificial polymer of step (a) is: (a) a copolymer of 5-ethylidene-2-norbornene and vinylbenzocyclobutene (or a vinylbenzocyclobutene derivative); or (b) a copolymer of 5-ethylidene-2-norbornene and 5-(3benzocyclobutylidene)-2-norbornene; or (c) a polymer of 5-(3benzocyclobutylidene)-2-norbornene. In addition, a semiconductor structure, having a sacrificial polymer positioned between conductor lines, wherein the sacrificial polymer is: (a) a copolymer of 5-ethylidene-2-norbornene and vinylbenzocyclobutene (or a vinylbenzocyclobutene derivative); or (b) a copolymer of 5-ethylidene-2-norbornene and 5-(3benzocyclobutylidene)-2-norbornene; or (c) a polymer of 5-(3benzocyclobutylidene)-2-norbornene.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.