Patent · US Expired

Method and apparatus for detecting resonance in electrostatically driven elements

US7598723B2 · kind B2 · utility

6Cited by
24References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 14, 2006
Grant dateOct 6, 2009
Priority date
Expiry dateFeb 14, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/0256
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and system is disclosed that can be used to directly detect and analyze an electric signal electrostatically induced a semi-conductive or conductive element at resonance. Through detection of the changes in the characteristics of the signal from the element, the disclosed devices can detect, for instance, presence of chemical/biological species in a sample or measure physical parameters of a sample such as pressure/acceleration, magnetic force, temperature, and/or extremely small masses. The disclosed systems include one or more micro- or nano-sized elements. Through modulation of an electric charge on a counter-electrode that is located at a pre-determined distance from the element, a modulating charge can be induced upon the element. Resonance can be directly detected via electronic monitoring of the induced signal for the higher harmonics of the natural resonant frequency.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.