Alignment receptacle of a sensor adapted to interact with a pin to generate position data along at least two transverse axes for docking a test head
US7598725B2 · kind B2 · utility
6Cited by
9References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 30, 2005 |
| Grant date | Oct 6, 2009 |
| Priority date | — |
| Expiry date | Dec 30, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2887
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method are provided for the automatic operation of a manipulator to move a test head or peripheral into position for proper alignment and docking of the test head with the peripheral. Examples of peripherals include a handler and a prober. Sensors are provided to obtain relative positional information of the test head in the relation to the peripheral, allowing a controller to issue instructions to the manipulator to correct differences in each of the six degrees of freedom between the mating surfaces of the test head and the manipulator.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.