Emulation of extended input/output measurement block facilities
US7600053B2 · kind B2 · utility
74Cited by
32References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 28, 2007 |
| Grant date | Oct 6, 2009 |
| Priority date | — |
| Expiry date | Jan 14, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/88
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An Extended Input/output (I/O) measurement block facility is emulated. The facility provides for the collection of relevant I/O measurement data, and the storing for later efficient retrieval of that data in an extended measurement block. The stored data relates to the performance of an I/O subchannel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.