Patent · US Active

Emulation of extended input/output measurement block facilities

US7600053B2 · kind B2 · utility

74Cited by
32References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 28, 2007
Grant dateOct 6, 2009
Priority date
Expiry dateJan 14, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2201/88
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An Extended Input/output (I/O) measurement block facility is emulated. The facility provides for the collection of relevant I/O measurement data, and the storing for later efficient retrieval of that data in an extended measurement block. The stored data relates to the performance of an I/O subchannel.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.