Method of determining the cause of an error state in an apparatus
US7600671B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 29, 2005 |
| Grant date | Oct 13, 2009 |
| Priority date | — |
| Expiry date | Mar 28, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG07F19/207
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method is described for determining the cause of an error state for one or more components within an apparatus. The apparatus comprises a plurality of sensors arranged to monitor the operation of components of the apparatus and a control means arranged to receive said information from said plurality of sensors. The method comprises analysing said sensor information in the form of an error log to ascertain sensor patterns from said sensor information comparing said sensor patterns with detectors, which are predefined patterns, indicative of the condition of said one or more components within the apparatus and classifying said sensor patterns as being indicative of said error state of a component or not based upon a comparison of sensor patterns with said detectors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.