Patent · US Active

System and method for downhole optical analysis

US7601950B2 · kind B2 · utility

6Cited by

10References

26Claims

0Family size

Assignee

Baker Hughes Holdings LLC · US

Inventors

Tobias Kischkat · Celle, DE
Stefen Sroka · Braunschweig, DE
Peter Schaefer · Pfungstadt, DE

Key dates

Filing date	Sep 25, 2007
Grant date	Oct 13, 2009
Priority date	—
Expiry date	Dec 8, 2027

Classification

Technology area (CPC E)Fixed Constructions
CPC primaryE21B49/0875
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for measuring optical properties of a fluid downhole, the method comprising measuring intensity of light interacting with the fluid downhole for each of one or more wavelengths; integrating each intensity of light for each wavelength for an integration time; and estimating the optical property from a difference between a starting value and an ending value for the integral of the intensity of light over time divided by the integration time for the wavelength. An apparatus is disclosed for measuring an optical property of a fluid downhole, the apparatus comprising one or more photodiodes that measure an intensity of light interacting with the fluid downhole for each of one or more wavelengths; and one or more integration circuits that each integrates an intensity of light for one wavelength for an integration time.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.